• DocumentCode
    613005
  • Title

    Combining checkpointing and scrubbing in FPGA-based real-time systems

  • Author

    Sari, Ali ; Psarakis, Mihalis ; Gizopoulos, D.

  • Author_Institution
    Dept. of Inf., Univ. of Piraeus, Piraeus, Greece
  • fYear
    2013
  • fDate
    April 29 2013-May 2 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    SRAM-based FPGAs provide an attractive solution for building high-performance embedded computing systems. Fault tolerant mechanisms are usually implemented in FPGA-based critical systems to improve their vulnerability to transient faults. Most fault tolerant approaches proposed so far in the literature for FPGA systems utilize checkpointing and scrubbing techniques for the fault recovery and repair operations, respectively, and rely on redundancy-based fault detection solutions. In this paper, we study the feasibility of building a low-cost fault-tolerant approach for FPGA-based realtime systems that combines checkpointing and scrubbing, the latter for both fault detection and repair. We calculate the checkpoint frequencies that guarantee the execution of the tasks within their deadlines in the presence of transient faults, taking into consideration the scrubbing time of the FPGA processor. Furthermore, we propose a selective scrubbing approach to reduce the scrubbing time and make feasible the fault tolerant execution of tasks with tight deadlines. We demonstrate the proposed approach in a Leon-3-based SoC in a Virtex-5 FPGA.
  • Keywords
    SRAM chips; embedded systems; fault tolerance; field programmable gate arrays; system-on-chip; FPGA processor; FPGA- based real-time systems; FPGA-based critical systems; Leon-3-based SoC; SRAM-based FPGA; Virtex-5 FPGA; checkpoint frequencies; checkpointing techniques; fault recovery operations; fault repair operations; high-performance embedded computing systems; low-cost fault-tolerant approach; redundancy-based fault detection solutions; scrubbing techniques; selective scrubbing approach; tasks fault tolerant execution; transient faults; Checkpointing; Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Real-time systems; Transient analysis; FPGAs; checkpointing; fault tolerance; scrubbing; transient faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2013 IEEE 31st
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-5542-1
  • Type

    conf

  • DOI
    10.1109/VTS.2013.6548910
  • Filename
    6548910