• DocumentCode
    613007
  • Title

    A programmable BIST design for PLL static phase offset estimation and clock duty cycle detection

  • Author

    Sen-Wen Hsiao ; Tzou, Nicholas ; Chatterjee, Avhishek

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol. Atlanta, Atlanta, GA, USA
  • fYear
    2013
  • fDate
    April 29 2013-May 2 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Reference spur is a nonlinear effect and important specification in PLL for long term jitter. Periodic events of reference clock create a static phase offset between signals. The finite phase offset comes from charge pump mismatch and layout asymmetry. This paper presents a built-in self-test (BIST) circuit applied for PLL static phase offset (SPO) estimation. The proposed circuit takes advantage of an integrator for time-to-voltage conversion (TVC). Along with comparators and counters, a BIST can be constructed for an estimation of mismatch ratio down to 1% over process corners in simulation (10 psec for lnsec pulse width). The calibration can be operated in a closed-loop PLL with lock signal. Additional circuits including delay lines and non-inverting amplifiers are designed for fast calibration. The result shows at least 27 times faster detection speed can be achieved over process corners. The phase offset between PLL reference and feedback signal is essentially the duty cycle difference, and the test is also applied for duty cycle distortion. Related analysis and measurement are included.
  • Keywords
    built-in self test; calibration; charge pump circuits; circuit layout; clocks; counting circuits; delay lines; feedback amplifiers; jitter; network synthesis; phase comparators; phase estimation; phase locked loops; PLL static phase offset estimation; SPO; TVC; built-in self-test circuit; calibration; charge pump; closed-loop PLL lock signal; comparator; delay line; duty cycle distortion; feedback signal; jitter; layout asymmetry; noninverting amplifier; programmable BIST design; reference clock duty cycle detection; time 1 ns; time 10 ps; time-to-voltage conversion; Built-in self-test; Clocks; Delay lines; Delays; Phase locked loops; Radiation detectors; Steady-state; BIST; PLL; TVC; duty cycle; integrator; mismatch; steady state phase offset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2013 IEEE 31st
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-5542-1
  • Type

    conf

  • DOI
    10.1109/VTS.2013.6548912
  • Filename
    6548912