• DocumentCode
    613022
  • Title

    A hybrid ECC and redundancy technique for reducing refresh power of DRAMs

  • Author

    Yun-Chao Yu ; Chih-Sheng Hou ; Li-Jung Chang ; Jin-Fu Li ; Chih-Yen Lo ; Ding-Ming Kwai ; Yung-Fa Chou ; Cheng-Wen Wu

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
  • fYear
    2013
  • fDate
    April 29 2013-May 2 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Dynamic random access memory (DRAM) is one key component in handheld devices. It typically consumes significant portion of the energy of the device even if the device is in standby mode due to the refresh requirement. This paper proposes a hybrid error-correcting code (ECC) and redundancy (HEAR) technique to reduce the refresh power of DRAMs in standby mode. The HEAR circuit consists of a Bose-Chaudhuri-Hocquenghem (BCH) module and an error-bit repair (EBR) module to raise the error correction capability and minimize the adverse effects caused by the ECC technique such that the refresh period can be effectively prolonged and considerable refresh power reduction can be achieved. Analysis results show that the proposed HEAR scheme can achieve 40~70% of energy saving for a 2Gb DDR3 DRAM in standby mode. The area cost of parity data and ECC circuit of HEAR scheme is only about 63 % and 53 % of that of the ECC-only, respectively.
  • Keywords
    BCH codes; DRAM chips; error correction codes; redundancy; BCH module; Bose-Chaudhuri-Hocquenghem module; DDR3 DRAM; EBR module; HEAR circuit; dynamic random access memory; error-bit repair module; error-correcting code; handheld devices; hybrid ECC technique; power reduction; redundancy; storage capacity 2 Gbit; Error correction; Error correction codes; Leakage currents; Maintenance engineering; Random access memory; Redundancy; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2013 IEEE 31st
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-5542-1
  • Type

    conf

  • DOI
    10.1109/VTS.2013.6548927
  • Filename
    6548927