Title :
On-chip circuit for measuring multi-GHz clock signal waveforms
Author :
Jenkins, Keith A. ; Restle, Phillip ; Wang, P.Z. ; Hogenmiller, D. ; Boerstler, David ; Bucelot, T.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
April 29 2013-May 2 2013
Abstract :
An on-chip circuit to measure full analog waveforms of internal signals is described. It can measure signals up to a repetition rate of at least 7 GHz, a bandwidth of at least 12 GHz, with accuracy required to detect subtle differences in signals, and it can measure overshoot above the rail voltage. It has been demonstrated on an experimental clock grid with optional resonant operation.
Keywords :
clocks; integrated circuit measurement; experimental clock grid; full analog waveform; multiGHz clock signal waveform measurement; on-chip circuit; optional resonant operation; subtle difference detection; Clocks; Frequency measurement; System-on-chip; Threshold voltage; Transmission line measurements; Voltage measurement; measurement circuit; on-chip; resonant clock; waveform;
Conference_Titel :
VLSI Test Symposium (VTS), 2013 IEEE 31st
Conference_Location :
Berkeley, CA
Print_ISBN :
978-1-4673-5542-1
DOI :
10.1109/VTS.2013.6548933
