• DocumentCode
    613529
  • Title

    On the on-line functional test of the Reorder Buffer memory in superscalar processors

  • Author

    Di Carlo, S. ; Sanchez, E. ; Sonza Reorda, M.

  • Author_Institution
    Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
  • fYear
    2013
  • fDate
    8-10 April 2013
  • Firstpage
    36
  • Lastpage
    41
  • Abstract
    The Reorder Buffer (ROB) is a key component in superscalar processors. It enables both in-order commitment of instructions and precise exception management even in those architectures that support out-of-order execution. The ROB architecture typically includes a memory array whose size may reach several thousands of bits. Testing this array may be important to guarantee the correct behavior of the processor. Proprietary BIST solutions typically adopted by manufacturers for end-of-production test are not always suitable for on-line test. In fact, they require the usage of test infrastructures that may be expensive, or may not be accessible and/or documented. This paper proposes an alternative solution, based on a functional approach, which has been validated resorting to both an architectural and a memory fault simulator.
  • Keywords
    buffer storage; built-in self test; memory architecture; multiprocessing systems; BIST; ROB architecture simulator; built-in self-test techniques; end-of-production test; exception management; instruction commitment; memory array testing; memory fault simulator; online functional test; out-of-order execution; reorder buffer memory; superscalar processors; Built-in self-test; Clocks; Couplings; Out of order; Registers; embedded memory test; microprocessor testing; on-line test; software-based self-test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
  • Conference_Location
    Karlovy Vary
  • Print_ISBN
    978-1-4673-6135-4
  • Electronic_ISBN
    978-1-4673-6134-7
  • Type

    conf

  • DOI
    10.1109/DDECS.2013.6549785
  • Filename
    6549785