DocumentCode
613534
Title
Design of stochastic Viterbi decoders for convolutional codes
Author
Te-Hsuan Chen ; Hayes, John P.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear
2013
fDate
8-10 April 2013
Firstpage
66
Lastpage
71
Abstract
The Viterbi algorithm is widely used to decode convolutional codes. We present an unconventional approach to Viterbi decoder design based on stochastic computing (SC) which represents data by random bit-streams that can be interpreted as probabilities. Stochastic circuits allow many decoding functions to be implemented by simple hardware; e.g., multi-bit multiplication can be realized by an AND gate. SC is also highly error-tolerant since a soft error (bit-flip) has little impact on a SC number´s value. It also allows decoding precision to be traded for decoding speed. We design two SC-based Viterbi decoders and also a hybrid binary-SC design; the latter uses SC for arithmetic calculations, but not for storing numbers. The proposed designs are compared with a binary (non-SC) decoder using a standard (7, 1/2) convolutional code. The SC designs are found to be more tolerant of soft errors in the decoder than the binary design, and more capable of supporting some useful trade-offs among area cost, data rate, precision, and bit-error rate.
Keywords
Viterbi decoding; convolutional codes; logic design; logic gates; stochastic processes; AND gate; SC number value; SC-based Viterbi decoders; Viterbi algorithm; area cost; binary decoder; bit-error rate; bit-flip; data rate; decoding functions; decoding precision; decoding speed; hybrid binary-SC design; multibit multiplication; probabilities; random bit-streams; soft error; soft errors; standard convolutional code; stochastic Viterbi decoder design; stochastic circuits; stochastic computing; Clocks; Convolutional codes; Decoding; Noise; Shift registers; Viterbi algorithm; Convolutional codes; Stochastic computing; Stochastic logic design; Viterbi decoders;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
Conference_Location
Karlovy Vary
Print_ISBN
978-1-4673-6135-4
Electronic_ISBN
978-1-4673-6134-7
Type
conf
DOI
10.1109/DDECS.2013.6549790
Filename
6549790
Link To Document