10Gb/s inverter based cascode transimpedance amplifier in 40nm CMOS technology

Author

Atef, M. ; Hong Chen ; Zimmermann, Horst

Author_Institution

Inst. of Electrodynamics Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria

fYear

2013

fDate

8-10 April 2013

Firstpage

72

Lastpage

75

Abstract

This work presents the design and performance of a 10Gbit/s transimpedance amplifier (TIA) implemented in a 40nm CMOS technology. The introduced TIA uses an inverter based cascode feedback (Inv-Cascode-TIA) with shunt feedback resistor. The TIA is followed by an one-stage single-ended common-source amplifier (CS), a two-stage differential amplifier and a 50Ω differential output driver to provide an interface to the measurement setup. The optical receiver shows an optical sensitivity of -21.4dBm for a BER= 10^-12. The transimpedance amplifier achieves a transimpedance gain of 55.3dBΩ, 8GHz bandwidth with 0.45pF total input capacitance. The power consumption of the TIA is 3.01mW and the complete chip dissipates 19.25mW for a 1.2V single supply voltage. The complete optical receiver has a 69.2dBΩ transimpedance gain and 7GHz bandwidth.

Keywords

CMOS analogue integrated circuits; differential amplifiers; feedback amplifiers; integrated circuit design; integrated circuit measurement; invertors; microwave integrated circuits; microwave power amplifiers; microwave receivers; operational amplifiers; optical receivers; power integrated circuits; resistors; CMOS technology; CS; bandwidth 7 GHz; bandwidth 8 GHz; bit rate 10 Gbit/s; capacitance 0.45 pF; differential output driver; inv-cascode-TIA; inverter based cascode feedback transimpedance amplifier; measurement setup; one-stage single-ended common-source amplifier; optical receiver; optical sensitivity; power 19.25 mW; power 3.01 mW; resistance 50 ohm; shunt feedback resistor; size 40 nm; two-stage differential amplifier; voltage 1.2 V; Bandwidth; CMOS integrated circuits; Capacitance; Inverters; Noise; Optical receivers; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on

Conference_Location

Karlovy Vary

Print_ISBN

978-1-4673-6135-4

Electronic_ISBN

978-1-4673-6134-7

Type

conf

DOI

10.1109/DDECS.2013.6549791

Filename

6549791