Efficiency of oscillation-based BIST in 90nm CMOS active analog filters

Author

Arbet, D. ; Nagy, G. ; Stopjakova, V. ; Gyepes, G.

Author_Institution

Inst. of Electron. & Photonics, Slovak Univ. of Technol., Bratislava, Slovakia

fYear

2013

fDate

8-10 April 2013

Firstpage

263

Lastpage

266

Abstract

Research presented in this paper is aimed at the comparison of the Oscillation-based Built-In Self Test (OBIST) efficiency in covering catastrophic and parametric faults in active analog integrated filters designed in two different technologies. Sallen-Key topologies of low-pass and high-pass filters were used as Circuit Under Test (CUT), designed in 0.35μm and 90nm CMOS technologies. The presented oscillation test strategy uses the on-chip Schmitt oscillator as the reference frequency source to compensate the influence of process parameter variations. Achieved results show that the proposed BIST approach is fully implementable in nanoscale technologies. Finally, dependence of the fault coverage on the oscillation frequency value was investigated.

Keywords

CMOS analogue integrated circuits; active filters; built-in self test; high-pass filters; low-pass filters; oscillators; CMOS active analog filters; CMOS technologies; CUT; OBIST; active analog integrated filters; catastrophic faults; circuit under test; high-pass filters; low-pass filters; on-chip Schmitt oscillator; oscillation-based built-in self test; parametric faults; reference frequency source; sallen-key topologies; size 0.35 mum; size 90 nm; Built-in self-test; CMOS integrated circuits; CMOS technology; Circuit faults; Oscillators; Resistance; System-on-chip; Oscillation-based BIST; catastrophic and parametric faults; fault detection; mixed-signal test; parametric test; technology variations;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on

Conference_Location

Karlovy Vary

Print_ISBN

978-1-4673-6135-4

Electronic_ISBN

978-1-4673-6134-7

Type

conf

DOI

10.1109/DDECS.2013.6549830

Filename

6549830