Title :
Efficiency of oscillation-based BIST in 90nm CMOS active analog filters
Author :
Arbet, D. ; Nagy, G. ; Stopjakova, V. ; Gyepes, G.
Author_Institution :
Inst. of Electron. & Photonics, Slovak Univ. of Technol., Bratislava, Slovakia
Abstract :
Research presented in this paper is aimed at the comparison of the Oscillation-based Built-In Self Test (OBIST) efficiency in covering catastrophic and parametric faults in active analog integrated filters designed in two different technologies. Sallen-Key topologies of low-pass and high-pass filters were used as Circuit Under Test (CUT), designed in 0.35μm and 90nm CMOS technologies. The presented oscillation test strategy uses the on-chip Schmitt oscillator as the reference frequency source to compensate the influence of process parameter variations. Achieved results show that the proposed BIST approach is fully implementable in nanoscale technologies. Finally, dependence of the fault coverage on the oscillation frequency value was investigated.
Keywords :
CMOS analogue integrated circuits; active filters; built-in self test; high-pass filters; low-pass filters; oscillators; CMOS active analog filters; CMOS technologies; CUT; OBIST; active analog integrated filters; catastrophic faults; circuit under test; high-pass filters; low-pass filters; on-chip Schmitt oscillator; oscillation-based built-in self test; parametric faults; reference frequency source; sallen-key topologies; size 0.35 mum; size 90 nm; Built-in self-test; CMOS integrated circuits; CMOS technology; Circuit faults; Oscillators; Resistance; System-on-chip; Oscillation-based BIST; catastrophic and parametric faults; fault detection; mixed-signal test; parametric test; technology variations;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
Conference_Location :
Karlovy Vary
Print_ISBN :
978-1-4673-6135-4
Electronic_ISBN :
978-1-4673-6134-7
DOI :
10.1109/DDECS.2013.6549830
