DocumentCode
613587
Title
TTTC: Test technology technical council
fYear
2013
fDate
8-10 April 2013
Firstpage
1
Lastpage
3
Abstract
Provides a listing of current committee members and society officers.
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
Conference_Location
Karlovy Vary
Print_ISBN
978-1-4673-6135-4
Electronic_ISBN
978-1-4673-6134-7
Type
conf
DOI
10.1109/DDECS.2013.6549843
Filename
6549843
Link To Document