• DocumentCode
    613587
  • Title

    TTTC: Test technology technical council

  • fYear
    2013
  • fDate
    8-10 April 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Provides a listing of current committee members and society officers.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
  • Conference_Location
    Karlovy Vary
  • Print_ISBN
    978-1-4673-6135-4
  • Electronic_ISBN
    978-1-4673-6134-7
  • Type

    conf

  • DOI
    10.1109/DDECS.2013.6549843
  • Filename
    6549843