Title :
MOF compliant fundamentals for multi-domain system modeling and simulation
Author :
Jungebloud, T. ; Jager, S. ; Maschotta, R. ; Zimmermann, Armin
Author_Institution :
Syst. & Software Eng. Group, Ilmenau Univ. of Technol., Ilmenau, Germany
Abstract :
Modern software frameworks for Model-Based Systems Engineering (MBSE) methodologies are proprietary and commonly restricts to a poor choice of domain specific languages. Furthermore, the interoperablity and model interchange support between frameworks is a technically hard challenge. The industrial strength standard OMG MOF (Meta-Object Facility) is a solid approach for the definition of domain specific languages. Applying meta-modeling techniques to existing modeling and simulation frameworks reduces obscurity of proprietarity and implicitely language characteristics. On the other hand, standard compliance improves product openness/transparency, reliability and confidence as for primary modes of operation. This paper presents a methodology to incorporate methods of meta-modeling and standard compliant domain specific languages in an existing modeling and simulation framework. First results are emerged and exemplified for an effective modeling dialect called MML (MLDesigner Modeling Language). Future prospects reviews already accomplished goals in this project, address several alternatives and improvements and gives an overview of ongoing development.
Keywords :
open systems; simulation languages; software engineering; systems engineering; MBSE; MLDesigner modeling language; MML; MOF compliant fundamentals; domain specific languages; interoperablity; meta-object facility; metamodeling techniques; model interchange; model-based systems engineering; modern software frameworks; multidomain system modeling; multidomain system simulation; Computational modeling; Educational institutions; Grammar; Metamodeling; Standards; Unified modeling language;
Conference_Titel :
Systems Conference (SysCon), 2013 IEEE International
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-3107-4
DOI :
10.1109/SysCon.2013.6549880