• DocumentCode
    614439
  • Title

    Automatic pattern recognition of epileptiform discharges using morphological descriptors and linear discriminant analysis

  • Author

    Fredel Boos, Christine ; Mendes de Azevedo, Fernando

  • Author_Institution
    Electr. Eng. Dept., Fed. Univ. of Santa Catarina, Florianopolis, Brazil
  • fYear
    2013
  • fDate
    16-19 April 2013
  • Firstpage
    293
  • Lastpage
    296
  • Abstract
    This paper presents the performance analysis of a methodology for automated recognition of epileptiform patterns using morphological descriptors and Linear Discriminant Analysis. Morphological descriptors, in this paper, are parameters related to the morphology of the signal´s waveform and Linear Discriminant Analysis (DA) is a method of multivariate statistical analysis commonly used for classification, size reduction and/or feature extraction. Thus, the main purpose of this paper is to analyze the classification performance of the discriminant functions and examine the applicability of Discriminant Analysis in reducing the number of independent variables (in this case morphological descriptors) necessary to obtain a discriminant function with acceptable classification performance. Simulations showed that the best functions exhibited efficiency greater than or equal to 85%, sensitivity of 85-90% and specificity between 80 and 84%.
  • Keywords
    electroencephalography; medical disorders; medical signal detection; medical signal processing; pattern recognition; signal classification; statistical analysis; automatic pattern recognition; classification performance; discriminant functions; epileptiform discharges; epileptiform patterns; feature extraction; linear discriminant analysis; morphological descriptors; morphology; multivariate statistical analysis; performance analysis; signal waveform; size reduction; Brain modeling; Conferences; Discharges (electric); Electroencephalography; Feature extraction; Linear discriminant analysis; Pattern recognition; EEG signal; epileptiform patterns; linear discriminant analysis; morphological descriptors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and Nanotechnology (ELNANO), 2013 IEEE XXXIII International Scientific Conference
  • Conference_Location
    Kiev
  • Print_ISBN
    978-1-4673-4669-6
  • Type

    conf

  • DOI
    10.1109/ELNANO.2013.6552017
  • Filename
    6552017