DocumentCode :
614458
Title :
Development of technology of multicomponent instrument compositions formation on the basis of porous silicon
Author :
Ivanovna, Zubko Evgeniya ; Yakovlevich, Shvets Evgenii
Author_Institution :
Dept. of Phys. & Biomed. Electron., Zaporozhye State Eng. Acad., Zaporozhye, Ukraine
fYear :
2013
fDate :
16-19 April 2013
Firstpage :
212
Lastpage :
216
Abstract :
Technological scheme for a formation of electron instrument compositions PcCu /por-Si/n-Si and PcAl/por-Si/n-Si has been developed. The data on the technological adaptation of the deposition and annealing of samples have been given. The effect of annealing for morphological and electrical characteristics of the obtained compositions has been investigated.
Keywords :
aluminium compounds; annealing; copper compounds; electrical resistivity; elemental semiconductors; multilayers; organometallic compounds; porous semiconductors; semiconductor-insulator boundaries; silicon; surface morphology; Si; annealing; deposition; electrical properties; morphological properties; multicomponent electron instrument compositions; porous silicon; Annealing; Films; Instruments; Silicon; Substrates; Surface treatment; Temperature; compositions; phthalocyanine; porous silicon; pulverization; structuring; substrates; technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Nanotechnology (ELNANO), 2013 IEEE XXXIII International Scientific Conference
Conference_Location :
Kiev
Print_ISBN :
978-1-4673-4669-6
Type :
conf
DOI :
10.1109/ELNANO.2013.6552036
Filename :
6552036
Link To Document :
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