• DocumentCode
    614518
  • Title

    Non-destructive volume and thickness measurements with planar microwave sensors

  • Author

    Al Jader, M. ; Korostynska, O. ; Mason, Alex ; Al-Shamma´a, A.I.

  • Author_Institution
    Built Environ. & Sustainable Technol. (BEST) Res. Inst., Liverpool John Moores Univ., Liverpool, UK
  • fYear
    2013
  • fDate
    16-19 April 2013
  • Firstpage
    465
  • Lastpage
    468
  • Abstract
    This paper reports on the development of novel microwave sensors for non-destructive volume and thickness measurements in real-time. The sensors are in the form of metal patterns printed on planar substrates, and the type of both the metal and the substrate used alters the sensitivity of the sensor. In particular, changes in the response of these sensors in the microwave region of the electromagnetic spectrum when in contact with deionised water of 10-350 μl volumes and polyvinyl cellulose in 0.15-0.60 mm thicknesses are used as an indicator of volume/thickness respectively. Resonant peaks change their frequency and amplitude depending on the type and amount of material brought in contact with the sensor. This method offers increased sensitivity, real-time response and non-destructive evaluation of material type and profile, which can be used for structural health monitoring, for concealed target detection and security, and in a range of biomedical applications.
  • Keywords
    microwave detectors; microwave propagation; nondestructive testing; polymers; thickness measurement; volume measurement; water; biomedical application; concealed target detection; deionised water; electromagnetic spectrum; metal pattern; nondestructive thickness measurement; nondestructive volume measurement; planar microwave sensor; planar substrate; polyvinyl cellulose; size 0.15 mm to 0.60 mm; structural health monitoring; Microwave measurement; Microwave sensors; Resonant frequency; Sensors; Substrates; microwave sensor; real-time measurements; resonant frequency shift; signature spectra; silver and gold printed patterns;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and Nanotechnology (ELNANO), 2013 IEEE XXXIII International Scientific Conference
  • Conference_Location
    Kiev
  • Print_ISBN
    978-1-4673-4669-6
  • Type

    conf

  • DOI
    10.1109/ELNANO.2013.6552096
  • Filename
    6552096