Title :
Contamination control and pilot manufacturing of commercial grade carbon nanotube colloidal formulations
Author :
Smith, Brian ; Kocab, Thomas ; Sen, Rahul ; Roberts, David A.
Author_Institution :
Quality Control & Characterization, Nantero, Inc., Boston, MA, USA
Abstract :
As an intermediate between discrete molecules and bulk materials, carbon nanotubes (CNTs) require a prescribed mix of processing tactics to scalably transform them from a heterogeneous blend of metal catalysts, amorphous carbons and CNTs into a robust colloidal formulation suitable for spin-on semiconductor applications such as non-volatile memory. In this manuscript, we will show historical quality control (QC) data collected over a four year period on three sequential generations of a single formulation. Results from this data will show that using our controlled processing methods, we can reproducibly prepare liter-scale quantities of spin-on CNTs formulations, meeting quality specifications expected for other electronics-grade thin-film precursors. Presented QC data will highlight our continuous improvement efforts in trace-metal (TM) control which has ultimately allowed us to reduce our process mean from ~40 ppbw total TM to less than 3 ppbw. QC defectivity data gathered from electron and optical microscopy will also be presented on each formulation generation, along with a description of the defect taxonomy developed which has help reduce defectivity in future formulations.
Keywords :
carbon nanotubes; colloids; contamination; electron device manufacture; electron microscopy; optical microscopy; quality control; semiconductor device manufacture; semiconductor nanotubes; semiconductor thin films; C; QC; amorphous carbons; commercial grade carbon nanotube colloidal formulations; contamination control; electron microscopy; electronics grade thin film precursors; metal catalysts; nonvolatile memory; optical microscopy; pilot manufacturing; quality control; trace-metal control; Carbon nanotubes; Films; Iron; Process control; Quality control; Carbon Nanotube; Quality Control; Scalable Manufacturing; Semiconductor Grade; thin film;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
Conference_Location :
Saratoga Springs, NY
Print_ISBN :
978-1-4673-5006-8
DOI :
10.1109/ASMC.2013.6552769