Title :
Lean manufacturing improvements supercharging direct observation with ethnography
Author :
Giessler, Matthias ; Fagan, Gerry ; Jaggers, Dan
Author_Institution :
Technol. Manuf. Eng., Intel Corp., Chandler, AZ, USA
Abstract :
This paper outlines how to drive innovative, practical solutions to advance semiconductor manufacturing by extending the value and impact of direct observation through integration with ethnographic practices.
Keywords :
lean production; semiconductor device manufacture; advance semiconductor manufacturing; ethnography; lean manufacturing; supercharging direct observation; Complexity theory; Lead; Maintenance engineering; Manufacturing; Problem-solving; Production facilities; Training; Lean/Six Sigma; direct observation; ethnography; semiconductor manufacturing; technology complexity;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
Conference_Location :
Saratoga Springs, NY
Print_ISBN :
978-1-4673-5006-8
DOI :
10.1109/ASMC.2013.6552773
