DocumentCode
614936
Title
Lean manufacturing improvements supercharging direct observation with ethnography
Author
Giessler, Matthias ; Fagan, Gerry ; Jaggers, Dan
Author_Institution
Technol. Manuf. Eng., Intel Corp., Chandler, AZ, USA
fYear
2013
fDate
14-16 May 2013
Firstpage
45
Lastpage
50
Abstract
This paper outlines how to drive innovative, practical solutions to advance semiconductor manufacturing by extending the value and impact of direct observation through integration with ethnographic practices.
Keywords
lean production; semiconductor device manufacture; advance semiconductor manufacturing; ethnography; lean manufacturing; supercharging direct observation; Complexity theory; Lead; Maintenance engineering; Manufacturing; Problem-solving; Production facilities; Training; Lean/Six Sigma; direct observation; ethnography; semiconductor manufacturing; technology complexity;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
Conference_Location
Saratoga Springs, NY
ISSN
1078-8743
Print_ISBN
978-1-4673-5006-8
Type
conf
DOI
10.1109/ASMC.2013.6552773
Filename
6552773
Link To Document