• DocumentCode
    614946
  • Title

    Automated metrology recipe creation

  • Author

    Haskins, Andrew ; Holfeld, Andre

  • Author_Institution
    GLOBALFOUNDRIES, Malta, NY, USA
  • fYear
    2013
  • fDate
    14-16 May 2013
  • Firstpage
    99
  • Lastpage
    104
  • Abstract
    A Metrology Recipe Automation capability has been have developed and deployed at GLOBALFOUNDRIES with the objective to support daily metrology recipe setup for foundry operations. Previous publications on this capability focused on recipe validation and benefits to process control through improved metrology. In this paper an overview of GLOBALFOUNDRIES´ Metrology Recipe Automation (MRA) solution will be provided. The benefits and justification of an MRA solution will be reviewed, and insight will be given into the production application, examining the primary business processes, software architecture and typical use case of the application. Necessary interaction with the design and tape out processes to integrate the necessary data will be covered, and the complexities of coordinating fab setup activities with design activities will be discussed. The paper will conclude with a discussion of the opportunities for improving vendor metrology tool software interaction, as well as the challenges of collaboration between fabless design firms with foundry manufacturing to insure the necessary data is available to enable automation.
  • Keywords
    design engineering; foundries; production engineering computing; semiconductor device manufacture; GLOBALFOUNDRIES; MRA solution; automated metrology recipe creation; daily metrology recipe setup; design activities; fab setup activities; fabless design firms; foundry manufacturing; foundry operations; metrology recipe automation solution; primary business process; process control; production application; recipe validation; software architecture; tape out process; vendor metrology tool software interaction; Automation; Business; Complexity theory; Geometry; Metrology; Software; Standards; factory automation; metrology recipe automation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
  • Conference_Location
    Saratoga Springs, NY
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-4673-5006-8
  • Type

    conf

  • DOI
    10.1109/ASMC.2013.6552783
  • Filename
    6552783