DocumentCode :
614946
Title :
Automated metrology recipe creation
Author :
Haskins, Andrew ; Holfeld, Andre
Author_Institution :
GLOBALFOUNDRIES, Malta, NY, USA
fYear :
2013
fDate :
14-16 May 2013
Firstpage :
99
Lastpage :
104
Abstract :
A Metrology Recipe Automation capability has been have developed and deployed at GLOBALFOUNDRIES with the objective to support daily metrology recipe setup for foundry operations. Previous publications on this capability focused on recipe validation and benefits to process control through improved metrology. In this paper an overview of GLOBALFOUNDRIES´ Metrology Recipe Automation (MRA) solution will be provided. The benefits and justification of an MRA solution will be reviewed, and insight will be given into the production application, examining the primary business processes, software architecture and typical use case of the application. Necessary interaction with the design and tape out processes to integrate the necessary data will be covered, and the complexities of coordinating fab setup activities with design activities will be discussed. The paper will conclude with a discussion of the opportunities for improving vendor metrology tool software interaction, as well as the challenges of collaboration between fabless design firms with foundry manufacturing to insure the necessary data is available to enable automation.
Keywords :
design engineering; foundries; production engineering computing; semiconductor device manufacture; GLOBALFOUNDRIES; MRA solution; automated metrology recipe creation; daily metrology recipe setup; design activities; fab setup activities; fabless design firms; foundry manufacturing; foundry operations; metrology recipe automation solution; primary business process; process control; production application; recipe validation; software architecture; tape out process; vendor metrology tool software interaction; Automation; Business; Complexity theory; Geometry; Metrology; Software; Standards; factory automation; metrology recipe automation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
Conference_Location :
Saratoga Springs, NY
ISSN :
1078-8743
Print_ISBN :
978-1-4673-5006-8
Type :
conf
DOI :
10.1109/ASMC.2013.6552783
Filename :
6552783
Link To Document :
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