DocumentCode
615570
Title
Reliability estimation for populations with limited and heavily censored failure information
Author
Chmura, Lukasz ; Morshuis, P.H.F. ; Gulski, Edward ; Smit, J.J. ; Janssen, Anton
Author_Institution
Delft Univ. of Technol., Delft, Netherlands
fYear
2013
fDate
2-5 June 2013
Firstpage
159
Lastpage
163
Abstract
Statistical analysis of the life data, is a useful tool helping to assess the life-time of populations of high-voltage components. More specific, the results of such analysis give overview over the failure behavior of the population under investigation, i.e. number and trend of expected failures. For the analysis, the detailed information about ages and numbers and ages of installed units and failed units has to be collected. Subsequently, the distribution representing the behavior of the population is fitted to the data. The latter allows deriving the time-dependent failure rate function, which in turn, directly indicates the trends of the future failures. However, this method requires homogeneous and independent data of sufficient amount. The latter becomes a problem, particularly that for past periods the failure data is often unavailable. It is important to estimate the population reliability and number of expected failures, for the whole population of components being operated. This is also important in the case when the available failure data comes only from one part of the area where the components are installed. In this paper we will show how to deal with populations where the available failure data is heavily censored, and what will the influence of the data division according to the regions in which the transformers are operated, on the failure expectancy.
Keywords
power system faults; power system reliability; power transformers; statistical analysis; censored failure information; data division; failed unit; failure behavior; failure data; failure expectancy; high-voltage component; installed unit; life data; life-time; population behavior distribution; population reliability estimation; statistical analysis; time-dependent failure rate function; transformer; Fitting; Reliability; Sociology; Statistical analysis; Weibull distribution; Windings; data censoring; failure analysis; reliability; tap-changers; transformers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation Conference (EIC), 2013 IEEE
Conference_Location
Ottawa, ON
Print_ISBN
978-1-4673-4738-9
Electronic_ISBN
978-1-4673-4739-6
Type
conf
DOI
10.1109/EIC.2013.6554224
Filename
6554224
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