Title :
Performance analysis of partial relay selection with feedback delay in the presence of interference in Nakagami-m fading channels
Author :
Al-Qahtani, Fawaz S. ; Caijun Zhong ; Radaydeh, Redha M. ; Alnuweiri, Hussein
Author_Institution :
Electr. & Comput. Eng. Program, Texas A&M Univ. at Qatar, Doha, Qatar
Abstract :
In this paper, we analyze the performance of a dual-hop system with partial relay selection and feedback delay over Nakagami-m fading channels in the presence of multiple identical interferers at the destination. Based on the new closed-form expressions for the cumulative distribution function of the effective signal-to-interference plus noise ratio, we present closed-form expressions for the outage probability and average symbol error rate (SER) for both fixed and CSI-assisted gain relaying systems. To gain further insights, the asymptotic outage probability and average symbol error rates at the high signal to noise ratio regimes are examined. Our results reveal that increasing the number of relays does not provide any extra diversity gain due to the presence of the feedback delay. Specifically, we show that feedback delay as well as CCI only affect the coding gain of the system. The accuracy of the analytical results are supported Monte-Carlo simulations.
Keywords :
Monte Carlo methods; Nakagami channels; encoding; error statistics; feedback; radiofrequency interference; relay networks (telecommunication); CCI; CSI-assisted gain relaying systems; Monte-Carlo simulations; Nakagami-m fading channels; SER; asymptotic outage probability; average symbol error rates; closed-form expressions; coding gain; cumulative distribution function; dual-hop system; feedback delay; fixed gain relaying systems; interference presence; multiple identical interferers; partial relay selection; performance analysis; signal-to-interference-plus-noise ratio; signal-to-noise ratio regimes; Delays; Encoding; Fading; Gain; Interference; Relays; Signal to noise ratio;
Conference_Titel :
Wireless Communications and Networking Conference (WCNC), 2013 IEEE
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-5938-2
Electronic_ISBN :
1525-3511
DOI :
10.1109/WCNC.2013.6555161