Title :
Subband interference suppression in channel shortening for OFDMA downlink systems
Author :
Hyun-Myung Kim ; Dongsik Kim ; Gi-Hong Im ; Seongwoo Ahn
Author_Institution :
Dept. of Electr. Eng., Pohang Univ. of Sci. & Technol. (POSTECH), Pohang, South Korea
Abstract :
In orthogonal frequency-division multiple access (OFDMA) downlink systems, user equipments over large delay spread channels reduce the cell spectral efficiency due to intersymbol interference (ISI). Channel shortening is an attractive filtering technique to mitigate ISI over such large delay spread scenarios, but the filter should be designed carefully to prevent subsequent spectrum null phenomenon. In this paper, we propose subband interference suppression (SIS) in channel shortening for OFDMA downlink systems. In our framework, we first develop the minimum subband interference (MSI) filter which reduces the interference and noise enhancement within the subcarriers of interest. To reduce its complexity, we present the delay preselection method, which predetermines significant delay candidates on the basis of estimation results. Simulation results show that the proposed SIS framework is effective over cellular scenarios, where conventional schemes do not work properly.
Keywords :
OFDM modulation; cellular radio; filtering theory; frequency division multiple access; interference filters; interference suppression; intersymbol interference; ISI mitigation; MSI filter; OFDMA downlink systems; SIS framework; cell spectral efficiency reduction; cellular radio; channel shortening; delay preselection method; filter design; interference reduction; intersymbol interference; large delay spread channels; minimum subband interference filter; noise enhancement; orthogonal frequency-division multiple access downlink systems; spectrum null phenomenon; subband interference suppression; user equipments; Bit error rate; Bit rate; Complexity theory; Delays; Interference; OFDM; Signal to noise ratio;
Conference_Titel :
Wireless Communications and Networking Conference (WCNC), 2013 IEEE
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-5938-2
Electronic_ISBN :
1525-3511
DOI :
10.1109/WCNC.2013.6555167