Title :
Metrics for the Measurement of the Quality of Stimuli in Radiation Testing Using Fast Hardware Emulation
Author :
Mogollon, J.M. ; Guzman-Miranda, H. ; Napoles, J. ; Aguirre, M.A.
Author_Institution :
Sch. of Eng., Univ. de Sevilla, Sevilla, Spain
Abstract :
Radiation Testing of unstructured digital circuits presents an extended set of difficulties related with detection and propagation of the faults to the primary outputs. Stimuli have to be chosen thinking on the possibility of propagating the faults through the logic to the primary outputs. Moreover, the set of stimuli should be selected to enhance the observability of both the time and location of the internal faults.
Keywords :
digital circuits; fault diagnosis; integrated circuit measurement; integrated circuit testing; radiation effects; hardware emulation; internal faults; primary outputs; radiation testing; stimuli set; unstructured digital circuits; Circuit faults; Dictionaries; Emulation; Hardware; Measurement; Testing; Vectors; Fault masking; hash codes; radiation testing; single event effects; test fixture;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2241079