DocumentCode :
616457
Title :
TD-LTE network indoor performance with Micro and Femto deployment in a realistic metropolitan scenario
Author :
Kang Jianfeng ; Zhao ZhuYan ; Guan Hao ; Vejlgaard, Benny ; Guangyi, Liu
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
fYear :
2013
fDate :
7-10 April 2013
Firstpage :
3948
Lastpage :
3952
Abstract :
In the wireless broadband network, most traffic are generated from indoor, and the indoor coverage is identified as the major bottleneck especially in dense urban environment with high-rising buildings. In this paper, the TD-LTE network downlink performance of indoor is studied with various deployment options, including outdoor Macro and Micro cell, indoor Femto cell and their combinations in a realistic large-scale dense urban scenario. For accurate modeling, the real three-dimensional (3D) city map of the investigated area is employed. A 3D ray-tracing tool is used to estimate the propagation occurring between outdoor sites and buildings. A semi-empirical building penetration extension is proposed to derive indoor predictions for each floor based on outdoor predictions at ground-level combined with a height gain model. The traffic offloading features of Micro and Femto cell are evaluated through system simulations.
Keywords :
Long Term Evolution; femtocellular radio; indoor communication; microcellular radio; telecommunication traffic; 3D ray-tracing tool; TD-LTE network downlink performance; TD-LTE network indoor performance; height gain model; high-rising building; indoor coverage; indoor femtocell; large-scale dense urban scenario; metropolitan scenario; outdoor macrocell; outdoor microcell; semiempirical building penetration extension; traffic offloading feature; wireless broadband network; Downlink; Floors; Mobile communication; Ray tracing; Solid modeling; Throughput; Femto cell; Micro cell; TD-LTE; height gain; indoor; system simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless Communications and Networking Conference (WCNC), 2013 IEEE
Conference_Location :
Shanghai
ISSN :
1525-3511
Print_ISBN :
978-1-4673-5938-2
Electronic_ISBN :
1525-3511
Type :
conf
DOI :
10.1109/WCNC.2013.6555207
Filename :
6555207
Link To Document :
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