Title :
Robust IQ imbalance estimation and compensation via specific preamble for 60 GHz systems
Author :
Changming Zhang ; Zhenyu Xiao ; Bo Gao ; Li Su ; Depeng Jin
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
Abstract :
The direct-conversion transceiver is an attractive architecture for 60 GHz wireless systems to meet the low-cost and low-power-consumption requirements, but it suffers from the IQ imbalance problem seriously. This paper adopts secondorder moment estimation to extract frequency-independent IQ imbalance parameters, and performs IQ compensation based on the estimation results. In order to achieve robust estimation, we employ a specific preamble sequence, where adjacent symbols have a fixed phase difference of π/2. The proposed estimation excels in the following aspects: (1) it completely eliminates the impact of inter-symbol interference (ISI) and carrier phase offset (CPO); (2) it is not degraded by carrier frequency offset (CFO), since the impact of which only lies in the negligible phase offset during only a symbol duration; (3) it has low computational complexity and can be implemented on hardware platform expediently. Simulation results indicate that the estimation algorithm has competitive performance over a large range of IQ imbalance, and with IQ compensation the bit-error-rate (BER) performance can be improved to that of the ideal case.
Keywords :
computational complexity; error statistics; interference suppression; intersymbol interference; low-power electronics; millimetre wave receivers; radio transceivers; CFO; CPO; ISI; bit error rate; carrier frequency offset; carrier phase offset; computational complexity; direct conversion transceiver; frequency 60 GHz; intersymbol interference; preamble sequence; second-order moment estimation; Bit error rate; Estimation; Hardware; Receivers; Signal to noise ratio; Transceivers; 60 GHz; IQ imbalance; direct-conversion transceiver; second-order moment estimation;
Conference_Titel :
Wireless Communications and Networking Conference (WCNC), 2013 IEEE
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-5938-2
Electronic_ISBN :
1525-3511
DOI :
10.1109/WCNC.2013.6555240