DocumentCode :
616639
Title :
Characterization of Multi Pixel Photon Counter (MPPC) Array. Statistical approach
Author :
Soto, Orlando ; Rojas, Renan ; Kuleshov, Sergey ; Hakobyan, H. ; Toro, Alam ; Brooks, William K. ; Olivares, Maria
Author_Institution :
Dept. de Ing. Electron., Univ. Tec. Federico Santa Maria, Valparaiso, Chile
fYear :
2013
fDate :
6-9 May 2013
Firstpage :
157
Lastpage :
161
Abstract :
The novel Hamamatsu Multi Pixel Photon Counter Array S12045(X) is an array of 16 individual MPPCs (3×3 [mm2]) (further in the article MPPC array channel) each with 3600 G-APD (Geiger-mode Avalanche Photodiode) pixels (50×50 [μ m2]). Each MPPC in the array works with its individual reverse bias voltage around 70[V]. We studied the main features of each MPPC array channel for 2800 MPPC arrays at different temperatures. Two measurement systems were built to extract Gain, Breakdown Voltage, Photon Detection Efficiency (PDE), Optical Cross-talk and Dark rate for each MPPC array channel. The article describes the characterization process of MPPC arrays used in GlueX experiment (Jefferson Lab, Hall D). The hardware and the performed data analysis are described, which include new analytical expressions to obtain the number of photoelectrons and Optical Cross-Talk. The dynamical behavior of characterization parameters is presented as well.
Keywords :
Geiger counters; avalanche photodiodes; data analysis; optical crosstalk; optical sensors; photodetectors; photon counting; sensor arrays; statistical analysis; voltage measurement; G-APD; Geiger-mode avalanche photodiode; GlueX experiment; Hamamatsu multipixel photon counter array channel; MPPC; PDE; breakdown voltage; dark rate; data analysis; gain extraction; measurement systems; optical crosstalk; photoelectron; photon detection efficiency; statistical approach; Arrays; Copper; Light emitting diodes; Monitoring; Optical crosstalk; Photonics; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location :
Minneapolis, MN
ISSN :
1091-5281
Print_ISBN :
978-1-4673-4621-4
Type :
conf
DOI :
10.1109/I2MTC.2013.6555401
Filename :
6555401
Link To Document :
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