Title :
Phase noise and transient measurement methods for V-band applications
Author :
Ya-Wen Ou ; Sy-Haur Su ; Yin-Cheng Chang ; Shuw-Guann Lin ; Hsu-Chen Cheng ; Ying-Zong Juang ; Da-Chiang Chang ; Hwann-Kaeo Chiou
Author_Institution :
Chip Implementation Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan
Abstract :
This study develops a dual-path cross-correlation technique and a single-path cascade method for phase noise and transient measurements up to the V-band frequency region. Further, this paper presents the complete test setup and test procedure. Results of the analyses of the single-path cascade measurement method and the signal-to-noise ratio (SNR) floor effects are also discussed in detail. We demonstrate a good agreement between the two proposed techniques.
Keywords :
correlation methods; electric noise measurement; phase measurement; phase noise; SNR; V-band frequency region; dual-path cross-correlation technique; phase noise; signal-to-noise ratio floor effect; single-path cascade measurement method; transient measurement method; Frequency measurement; Frequency modulation; Mixers; Noise measurement; Phase measurement; Phase noise; Transient analysis; SNR; dual path cross correlation; phase noise; single path cascade; transient;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location :
Minneapolis, MN
Print_ISBN :
978-1-4673-4621-4
DOI :
10.1109/I2MTC.2013.6555460
