DocumentCode
616809
Title
Characterization of ultra-thin silicon strip detectors for hadrontherapy beam monitoring
Author
Bouterfa, M. ; Aouadi, K. ; Flandre, Denis ; Gil, Eduardo Cortina
Author_Institution
Inf. & Commun. Technol., Electron. & Appl. Math. (ICTEAM), Inst. Univ. Catholique de Louvain (UCL), Louvain-la-Neuve, Belgium
fYear
2013
fDate
6-9 May 2013
Firstpage
1088
Lastpage
1091
Abstract
For precise treatment purposes in hadrontherapy, the particle beam has to be monitored in real time without being degraded. For the first time, silicon strip detectors have been fabricated over an area as large as 4.5cm x 4.5cm with ultra low thickness of 20 microns in order to reduce the beam scattering. In this work, we briefly describe the fabrication process and characterize this novel detector consisting of 81 4cm-long strips. Fabrication was carried out in the cleanroom facilities of Université catholique de Louvain starting from p-type thick-SOI wafers. A 62MeV proton beam similar to the ones in clinical treatments has been used to irradiate the sensor at Cyclotron Research Center, Louvain-la-Neuve. The considered parameters were dark current and signal strip repeatability, linearity versus dose rate, and response uniformity through the wafer. The fabrication process was successful and characterization gave satisfactory results. These novel fabricated devices constitute a very promising technology for future in-vivo, non-invasive verification of the actual treatment delivery in hadrontherapy.
Keywords
dosimetry; radiation therapy; semiconductor counters; Cyclotron Research Center; beam scattering; cleanroom facility; clinical treatment; dose rate; electron volt energy 62 MeV; hadrontherapy beam monitoring; linearity; particle beam; response uniformity; signal strip repeatability; ultrathin silicon strip detector; Detectors; Fabrication; Monitoring; Particle beams; Protons; Silicon; Strips; Beam monitoring; Bio-medical instrumentation; Dosimetry; Particle therapy; Silicon strip detector;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location
Minneapolis, MN
ISSN
1091-5281
Print_ISBN
978-1-4673-4621-4
Type
conf
DOI
10.1109/I2MTC.2013.6555582
Filename
6555582
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