Title :
Real-time processing of multi-frequency eddy currents testing signals
Author :
Rosado, Luis S. ; Catarrunas, Tiago ; Piedade, Moises ; Ramos, Pedro M.
Author_Institution :
Inst. de Telecomun., Univ. Tec. de Lisboa, Lisbon, Portugal
Abstract :
In this paper, a real-time Digital Signal Processing (DSP) architecture is proposed to generate and process multi-frequency signals for eddy currents testing. This architecture was implemented on a dedicated instrument whose processing core is a Field-Programmable Gate Array (FPGA) for DSP purposes. Stimulus generation is achieved using Direct Digital Synthesis (DDS) with some improvements to remove spurious frequency components. An In-phase and Quadrature (IQ) demodulation scheme is implemented to estimate the real and imaginary part of the probes output signals. A Cascaded Integrator Comb (CIC) decimator is used to lower the sampling frequency allowing narrowband IIR filtering using low resources. The proposed architecture is able to generate and process the stimulus and input data at 125 MSamples/s and to estimate the input data components at 1.25 MSamples/s rate for frequencies between 50 kHz and 10 MHz.
Keywords :
IIR filters; direct digital synthesis; eddy current testing; field programmable gate arrays; phase modulation; signal processing; CIC decimator; DDS; FPGA; IQ demodulation scheme; cascaded integrator comb decimator; direct digital synthesis; field-programmable gate array; frequency 50 kHz to 10 MHz; in-phase and quadrature demodulation scheme; multifrequency eddy current testing signal real-time processing; multifrequency signal processing; narrowband IIR filtering; real-time DSP architecture; real-time digital signal processing architecture; stimulus generation; Computer architecture; Demodulation; Digital signal processing; Eddy currents; IIR filters; Probes; Testing; Digital Signal Processing; Eddy Currents Testing; Field-Programmable Gate Array; Multi-Frequency Stimulus;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location :
Minneapolis, MN
Print_ISBN :
978-1-4673-4621-4
DOI :
10.1109/I2MTC.2013.6555631