Illumination design in vision-based measurement systems

In industrial inspection systems adopting machine vision devices and algorithms, a fundamental role is played by the illumination sub-system, since its good design helps in making the software simpler and more robust and reliable. However, the configuration of the illumination parameters is often effected by trial and error and may result into non-optimal solutions, higher costs and worse uncertainty of final measurements. This paper describes an analytical model of the whole system composed of illuminator, surface under measurement and camera, which can be used as a basis to immediately set up the illumination subsystem. Results will be reported showing the achievable improvements, also as a reduction of the measurement uncertainty.