Title :
Design and development of an accelerated testing architecture for embedded systems fault monitoring
Author :
Scarano, Valeria L. ; Catelani, Marcantonio ; Mazzei, Daniele ; Carignano, Andrea ; Baldi, Giacomo
Author_Institution :
Dept. of Electron. & Telecommun., Univ. of Florence, Florence, Italy
Abstract :
The evaluation of reliability performances of a commercial embedded module was proposed. Testing procedure, hardware and software architecture for on-line fault monitoring was implemented. By means of the application of accelerated climatic testing, the final challenge is to implement a model able to statistically prove the quality and reliability of the module.
Keywords :
embedded systems; fault diagnosis; hardware-software codesign; life testing; reliability; accelerated climatic testing; accelerated testing architecture; embedded systems; fault monitoring; hardware and software architecture; reliability performances; Embedded systems; Life estimation; Materials; Software reliability; Stress; Testing; accelerated testing; embedded system; fault monitoring; reliability analysis;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location :
Minneapolis, MN
Print_ISBN :
978-1-4673-4621-4
DOI :
10.1109/I2MTC.2013.6555682
