DocumentCode
616900
Title
Design and development of an accelerated testing architecture for embedded systems fault monitoring
Author
Scarano, Valeria L. ; Catelani, Marcantonio ; Mazzei, Daniele ; Carignano, Andrea ; Baldi, Giacomo
Author_Institution
Dept. of Electron. & Telecommun., Univ. of Florence, Florence, Italy
fYear
2013
fDate
6-9 May 2013
Firstpage
1590
Lastpage
1593
Abstract
The evaluation of reliability performances of a commercial embedded module was proposed. Testing procedure, hardware and software architecture for on-line fault monitoring was implemented. By means of the application of accelerated climatic testing, the final challenge is to implement a model able to statistically prove the quality and reliability of the module.
Keywords
embedded systems; fault diagnosis; hardware-software codesign; life testing; reliability; accelerated climatic testing; accelerated testing architecture; embedded systems; fault monitoring; hardware and software architecture; reliability performances; Embedded systems; Life estimation; Materials; Software reliability; Stress; Testing; accelerated testing; embedded system; fault monitoring; reliability analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International
Conference_Location
Minneapolis, MN
ISSN
1091-5281
Print_ISBN
978-1-4673-4621-4
Type
conf
DOI
10.1109/I2MTC.2013.6555682
Filename
6555682
Link To Document