Title :
Hardware implementations and performance assessments of a DC magnetron sputter for enhanced depositions
Author :
Cheng-Tsung Liu ; Chih-Wen Chang
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
To refine the substrate deposition results, some supplementary mechanical adjustments can be designed and implemented onto the existing DC magnetron sputters (MS). By the assistances of these attachments along with proper controls on the magnetic and electric field paths inside the vacuum chamber, results indicated that more target atoms can be sputtered and smoother depositions on the substrate surface can be achieved. Based on appropriate performance index selections, operations of the DC MS were thoroughly investigated. Selected regions on the deposited substrate surface will be probed with thickness gauge and atomic force microscopy, thus the operational performances of the DC MS with structural refinements can be assessed and the desired improvements can then be systematically validated.
Keywords :
atomic force microscopy; electric field effects; magnetic field effects; sputter deposition; DC magnetron sputter; atomic force microscopy; electric field path; enhanced depositions; hardware implementations; magnetic field path; performance assessments; performance index selections; proper controls; structural refinements; substrate deposition; substrate surface; supplementary mechanical adjustments; thickness gauge; vacuum chamber; Magnetic flux; Plasma measurements; Plasmas; Sputtering; Substrates; Surface treatment; Thickness measurement; Permanent magnet; magnetron sputter; operational trajectory; substrate deposition;
Conference_Titel :
Electric Machines & Drives Conference (IEMDC), 2013 IEEE International
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4673-4975-8
Electronic_ISBN :
978-1-4673-4973-4
DOI :
10.1109/IEMDC.2013.6556338