DocumentCode
617464
Title
THALIA - An automatic hierarchical analysis system to detect drusen lesion images for amd assessment
Author
Wong, Damon Wing Kee ; Jiang Liu ; Xiangang Cheng ; Jielin Zhang ; Fengshou Yin ; Bhargava, Mudit ; Cheung, G.C.M. ; Tien Yin Wong
Author_Institution
Inst. for Infocomm Res., A*STAR, Singapore, Singapore
fYear
2013
fDate
7-11 April 2013
Firstpage
884
Lastpage
887
Abstract
Age-related macular degeneration (AMD) is a leading cause of permanent blindness. In its early stage AMD is characterized by drusen which are extracellelur deposits in the retina. In this paper, we present THALIA, an automatic system for the detection of drusen images for AMD assessment. First, the macular region of interest is detected using a seeded mode tracking approach. The macular region of interest is then mapped into a new representation using a hierarchicial word transform (HWI). In HWI, dense sampling is first carried out to generate structured pixels which embed local context. These structured pixels are then clustered using hierarchical k-means. The HWI image is subsequently classified using a SVM-based classifier. We have tested THALIA on a dataset of 350 images and obtained an accuracy of 95.46%. Results are promising for further validation of the THALIA system.
Keywords
eye; image classification; image sampling; medical image processing; support vector machines; vision defects; SVM-based classifier; THALIA; age-related macular degeneration assessment; automatic hierarchical analysis system; dense sampling; drusen lesion image detection; extracellular deposits; hierarchical k-means clustering; hierarchicial word transform; image classification; macular region-of-interest; permanent blindness; retina; seeded mode tracking approach; structured pixels; support vector machines; Blindness; Context; Histograms; Image color analysis; Image recognition; Retina; Visualization; AMD; drusen; retinal image;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
Conference_Location
San Francisco, CA
ISSN
1945-7928
Print_ISBN
978-1-4673-6456-0
Type
conf
DOI
10.1109/ISBI.2013.6556617
Filename
6556617
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