DocumentCode :
617464
Title :
THALIA - An automatic hierarchical analysis system to detect drusen lesion images for amd assessment
Author :
Wong, Damon Wing Kee ; Jiang Liu ; Xiangang Cheng ; Jielin Zhang ; Fengshou Yin ; Bhargava, Mudit ; Cheung, G.C.M. ; Tien Yin Wong
Author_Institution :
Inst. for Infocomm Res., A*STAR, Singapore, Singapore
fYear :
2013
fDate :
7-11 April 2013
Firstpage :
884
Lastpage :
887
Abstract :
Age-related macular degeneration (AMD) is a leading cause of permanent blindness. In its early stage AMD is characterized by drusen which are extracellelur deposits in the retina. In this paper, we present THALIA, an automatic system for the detection of drusen images for AMD assessment. First, the macular region of interest is detected using a seeded mode tracking approach. The macular region of interest is then mapped into a new representation using a hierarchicial word transform (HWI). In HWI, dense sampling is first carried out to generate structured pixels which embed local context. These structured pixels are then clustered using hierarchical k-means. The HWI image is subsequently classified using a SVM-based classifier. We have tested THALIA on a dataset of 350 images and obtained an accuracy of 95.46%. Results are promising for further validation of the THALIA system.
Keywords :
eye; image classification; image sampling; medical image processing; support vector machines; vision defects; SVM-based classifier; THALIA; age-related macular degeneration assessment; automatic hierarchical analysis system; dense sampling; drusen lesion image detection; extracellular deposits; hierarchical k-means clustering; hierarchicial word transform; image classification; macular region-of-interest; permanent blindness; retina; seeded mode tracking approach; structured pixels; support vector machines; Blindness; Context; Histograms; Image color analysis; Image recognition; Retina; Visualization; AMD; drusen; retinal image;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
Conference_Location :
San Francisco, CA
ISSN :
1945-7928
Print_ISBN :
978-1-4673-6456-0
Type :
conf
DOI :
10.1109/ISBI.2013.6556617
Filename :
6556617
Link To Document :
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