• DocumentCode
    617490
  • Title

    High-resolution electroencephalographic forward modeling in traumatic brain injury using the finite element method

  • Author

    Goh, S. Y. Matthew ; Irimia, A. ; Torgerson, Carinna M. ; Kikinis, Ron ; Vespa, Paul M. ; van Horn, John D.

  • Author_Institution
    Lab. of Neuro Imaging, Univ. of California, Los Angeles, Los Angeles, CA, USA
  • fYear
    2013
  • fDate
    7-11 April 2013
  • Firstpage
    990
  • Lastpage
    993
  • Abstract
    Localization of electrical brain activity via electroencephalography (EEG) remains a challenging task in traumatic brain injury (TBI) patients, partly due to the complexity of structural brain changes resulting from neurological insult. When localizing EEG-recorded brain activity, the failure to account for pathology-related changes in tissue conductivities may cause forward model inaccuracies which translate into large localization errors. Here, the effects of TBI-related pathology upon the accuracy of the EEG forward matrix are explored in the context of a realistic finite element method (FEM) model of the head with 25 tissue types. It is found that the omission of TBI pathology from the anatomical model can lead to substantial inaccuracies in the calculation of the forward matrix, with EEG lead field focality being underestimated by as much as ~90% if TBI-related conductivity changes are ignored. Our study is the first to rigorously quantify the extent to which TBI-related pathology can affect forward EEG calculations.
  • Keywords
    diseases; electroencephalography; finite element analysis; injuries; medical image processing; neurophysiology; EEG forward matrix; FEM model; TBI-related pathology; electrical brain activity localization; high-resolution electroencephalographic forward modeling; image processing; neurological insult; realistic finite element method; tissue conductivity; traumatic brain injury; Brain models; Conductivity; Electroencephalography; Head; Pathology; Sensors; electroencephalography; epilepsy; finite element method; traumatic brain injury;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4673-6456-0
  • Type

    conf

  • DOI
    10.1109/ISBI.2013.6556643
  • Filename
    6556643