DocumentCode :
61757
Title :
Wireless communication at 310 GHz using GaAs high-electron-mobility transistors for detection
Author :
Blin, S. ; Tohme, L. ; Coquillat, Dominique ; Horiguchi, Shogo ; Minamikata, Yusuke ; Hisatake, Shintaro ; Nouvel, P. ; Cohen, Thomas ; Penarier, A. ; Cano, Frank ; Varani, Luca ; Knap, Wojciech ; Nagatsuma, Tadao
Author_Institution :
GIS Teralab, Univ. Montpellier 2, Montpellier, France
Volume :
15
Issue :
6
fYear :
2013
fDate :
Dec. 2013
Firstpage :
559
Lastpage :
568
Abstract :
We report on the first error-free terahertz (THz) wireless communication at 0.310 THz for data rates up to 8.2 Gbps using a 18-GHz-bandwidth GaAs/AlGaAs field-effect transistor as a detector. This result demonstrates that low-cost commercially-available plasma-wave transistors whose cut-off frequency is far below THz frequencies can be employed in THz communication. Wireless communication over 50 cm is presented at 1.4 Gbps using a uni-travelling-carrier photodiode as a source. Transistor integration is detailed, as it is essential to avoid any deleterious signals that would prevent successful communication. We observed an improvement of the bit error rate with increasing input THz power, followed by a degradation at high input power. Such a degradation appears at lower powers if the photodiode bias is smaller. Higher-data-rate communication is demonstrated using a frequency-multiplied source thanksto higher output power. Bit-error-rate measurements at data rates up to 10 Gbps are performed for different input THz powers. As expected, bit error rates degrade as data rate increases. However, degraded communication is observed at some specific data rates. This effect is probably due to deleterious cavity effects and/or impedance mismatches. Using such a system, realtime uncompressed high-definition video signal is successfully and robustly transmitted.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; photodiodes; radiocommunication; GaAs-AlGaAs; THz communication; bandwidth 18 GHz; bit error rate; bit rate 1.4 Gbit/s; bit-error-rate measurements; data rate; deleterious cavity effects; error-free terahertz wireless communication; field-effect transistor; frequency 310 GHz; frequency-multiplied source; high-electron-mobility transistors; higher-data-rate communication; impedance mismatches; photodiode bias; plasma-wave transistors; real-time uncompressed high-definition video signal; transistor integration; uni-travelling-carrier photodiode; Bandwidth; Detectors; Frequency modulation; HEMTs; Sensitivity; Communications technology; FET; HEMT; THz; plasma waves; receivers;
fLanguage :
English
Journal_Title :
Communications and Networks, Journal of
Publisher :
ieee
ISSN :
1229-2370
Type :
jour
DOI :
10.1109/JCN.2013.000104
Filename :
6713771
Link To Document :
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