• DocumentCode
    617604
  • Title

    Proper ordered meshing of complex shapes and optimal graph cuts applied to atrial-wall segmentation from DE-MRI

  • Author

    Veni, G. ; Zhisong Fu ; Awate, Suyash P. ; Whitaker, Ross T.

  • Author_Institution
    Sci. Comput. & Imaging (SCI) Inst., Univ. of Utah, Salt Lake City, UT, USA
  • fYear
    2013
  • fDate
    7-11 April 2013
  • Firstpage
    1296
  • Lastpage
    1299
  • Abstract
    Segmentation of the left atrium wall from delayed enhancement MRI is challenging because of inconsistent contrast combined with noise and high variation in atrial shape and size. This paper presents a method for left-atrium wall segmentation by using a novel sophisticated mesh-generation strategy and graph cuts on a proper ordered graph. The mesh is part of a template/model that has an associated set of learned intensity features. When this mesh is overlaid onto a test image, it produces a set of costs on the graph vertices which eventually leads to an optimal segmentation. The novelty also lies in the construction of proper ordered graphs on complex shapes and for choosing among distinct classes of base shapes/meshes for automatic segmentation. We evaluate the proposed segmentation framework quantitatively on simulated and clinical cardiac MRI.
  • Keywords
    biomedical MRI; cardiology; delays; feature extraction; graphs; image enhancement; image segmentation; medical image processing; mesh generation; atrial shape variation; atrial size variation; clinical cardiac MRI; delayed enhancement MRI; graph cuts; graph vertices; learned intensity feature set; left-atrium wall segmentation; magnetic resonance imaging; mesh generation strategy; simulated cardiac MRI; Abstracts; Detectors; Feature extraction; Image edge detection; Image segmentation; Magnetic resonance imaging; Optimization; Atrial Fibrillation; Geometric Graph; Mesh Generation; Minimum s-t cut; Optimal surfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4673-6456-0
  • Type

    conf

  • DOI
    10.1109/ISBI.2013.6556769
  • Filename
    6556769