Title :
Intensity standardization of longitudinal images using 4D clustering
Author :
Qing He ; Shiee, Navid ; Reich, Daniel S. ; Calabresi, Peter A. ; Pham, Dzung L.
Author_Institution :
Center for Neurosci. & Regenerative Med, Henry M. Jackson Found. for the Advancement of Mil. Med., Bethesda, MD, USA
Abstract :
Longitudinal magnetic resonance (MR) images of the same subject often vary significantly in their overall contrast. Intensity standardization aims to minimize the inter-scan intensity variations by transforming the intensities into a standard gray scale, but true anatomical changes over time are often masked out. We propose an intensity standardization method based on four dimensional Fuzzy C-means (FCM) clustering over longitudinal images. Assuming that the images in the longitudinal series of the same subject have been spatially aligned, our method tries to find for each image a piecewise linear intensity transformation function that minimizes the 4D energy function. The performance of our method is evaluated through the volume measurements of the tissue segmentation. Results show that our method can minimize the scanner induced intensity variation among longitudinal images, while preserving intensity variations caused by anatomical changes.
Keywords :
biological tissues; biomedical MRI; fuzzy set theory; image segmentation; medical image processing; minimisation; pattern clustering; piecewise linear techniques; standardisation; 4D clustering; 4D energy function minimization; four dimensional Fuzzy C-means clustering; intensity standardization method; intensity variation preservation; interscan intensity variation; longitudinal magnetic resonance image; longitudinal series; piecewise linear intensity transformation function; standard gray scale; tissue segmentation; true anatomical changes; volume measurement; Biomedical imaging; Histograms; Image segmentation; Magnetic resonance imaging; Standards; Intensity standardization; fuzzy c-means; longitudinal images;
Conference_Titel :
Biomedical Imaging (ISBI), 2013 IEEE 10th International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-6456-0
DOI :
10.1109/ISBI.2013.6556792