DocumentCode :
618509
Title :
Channel analysis of High Speed Digital Module and correlation between simulations and measurements
Author :
Mazzocchi, S. ; Giacometti, R. ; Sassaroli, D.
Author_Institution :
Hardware Dev. Dept., D.&P. Electron. Syst., Frascati, Italy
fYear :
2013
fDate :
12-15 May 2013
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, Signal integrity (SI) analysis is used to analyze effect of crosstalk on performance of a High Speed Digital Module: its most critical part is simulated by ADS, a simulation tool, and then it is measured by an oscilloscope to verify the correctness of results. Technology trends toward higher speed and device density have increased complexity of PCB design to support fast varying and broadband signals without degrading the SI to unacceptable levels. The SI analysis relies on time-domain simulation of pseudo-random data patterns with at rates about 1 Gb/s. The models, like IBIS and SPICE, are required to describe the electrical behavior of the integrated components involved at interconnect traces. This paper is focused on crosstalk, which is one of the main issues of concern for SI. The final result validation is important to define the limitation of simulation for the pre- and post- layouts of electronic board and to reduce the design risk.
Keywords :
crosstalk; printed circuit layout; time-domain analysis; ADS simulation tool; IBIS; PCB design complexity; SI analysis; SPICE; broadband signal; channel analysis; crosstalk; device density; electrical behavior; electronic board post-layout; electronic board pre-layout; fast varying signal; high-speed digital module; integrated components; interconnect traces; oscilloscope; pseudorandom data patterns; signal integrity analysis; time-domain simulation; Analytical models; Connectors; Crosstalk; Field programmable gate arrays; Probes; Receivers; Silicon; Advanced Design System (ADS); Crosstalk; FPGA Mezzanine Card (FMC); Grid Plane; High Speed Circuit Design; IBIS; Pseudo Random Bit Sequence (PRBS); SPICE; Signal Integrity (SI);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5678-7
Type :
conf
DOI :
10.1109/SaPIW.2013.6558320
Filename :
6558320
Link To Document :
بازگشت