• DocumentCode
    618509
  • Title

    Channel analysis of High Speed Digital Module and correlation between simulations and measurements

  • Author

    Mazzocchi, S. ; Giacometti, R. ; Sassaroli, D.

  • Author_Institution
    Hardware Dev. Dept., D.&P. Electron. Syst., Frascati, Italy
  • fYear
    2013
  • fDate
    12-15 May 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, Signal integrity (SI) analysis is used to analyze effect of crosstalk on performance of a High Speed Digital Module: its most critical part is simulated by ADS, a simulation tool, and then it is measured by an oscilloscope to verify the correctness of results. Technology trends toward higher speed and device density have increased complexity of PCB design to support fast varying and broadband signals without degrading the SI to unacceptable levels. The SI analysis relies on time-domain simulation of pseudo-random data patterns with at rates about 1 Gb/s. The models, like IBIS and SPICE, are required to describe the electrical behavior of the integrated components involved at interconnect traces. This paper is focused on crosstalk, which is one of the main issues of concern for SI. The final result validation is important to define the limitation of simulation for the pre- and post- layouts of electronic board and to reduce the design risk.
  • Keywords
    crosstalk; printed circuit layout; time-domain analysis; ADS simulation tool; IBIS; PCB design complexity; SI analysis; SPICE; broadband signal; channel analysis; crosstalk; device density; electrical behavior; electronic board post-layout; electronic board pre-layout; fast varying signal; high-speed digital module; integrated components; interconnect traces; oscilloscope; pseudorandom data patterns; signal integrity analysis; time-domain simulation; Analytical models; Connectors; Crosstalk; Field programmable gate arrays; Probes; Receivers; Silicon; Advanced Design System (ADS); Crosstalk; FPGA Mezzanine Card (FMC); Grid Plane; High Speed Circuit Design; IBIS; Pseudo Random Bit Sequence (PRBS); SPICE; Signal Integrity (SI);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-5678-7
  • Type

    conf

  • DOI
    10.1109/SaPIW.2013.6558320
  • Filename
    6558320