• DocumentCode
    618533
  • Title

    Modeling and minimizing the inductance of bond wire interconnects

  • Author

    Ndip, Ivan ; Oz, Abdurrahman ; Guttowski, Stephan ; Reichl, Herbert ; Lang, K.-D. ; Henke, Heino

  • Author_Institution
    Fraunhofer IZM, Berlin, Germany
  • fYear
    2013
  • fDate
    12-15 May 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a novel analytical model for calculating the partial self-inductance of bond wires in dependent on bonding parameters such as loop height, distance between bonding positions and the thickness of the metallization on which the wire is bonded, is derived for the first time. An excellent correlation is obtained between inductances extracted using our proposed model and those extracted using Ansys Q3D, with a maximum deviation of approximately 1%. Furthermore, methods for minimizing the inductance of bond wires, based on the definitions of loop and partial inductances are discussed. Test bond wire structures are designed, fabricated and measured to quantify the implemented method.
  • Keywords
    integrated circuit design; integrated circuit metallisation; integrated circuit modelling; lead bonding; Ansys Q3D; bond wire interconnects; bonding parameter; bonding position; inductance minimization; inductance modeling; loop height; loop inductance; metallization thickness; partial self-inductance; test bond wire structure design; test bond wire structure fabrication; test bond wire structure measurement; Analytical models; Bonding; Inductance; Integrated circuit interconnections; Integrated circuit modeling; Solid modeling; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-5678-7
  • Type

    conf

  • DOI
    10.1109/SaPIW.2013.6558344
  • Filename
    6558344