DocumentCode
618533
Title
Modeling and minimizing the inductance of bond wire interconnects
Author
Ndip, Ivan ; Oz, Abdurrahman ; Guttowski, Stephan ; Reichl, Herbert ; Lang, K.-D. ; Henke, Heino
Author_Institution
Fraunhofer IZM, Berlin, Germany
fYear
2013
fDate
12-15 May 2013
Firstpage
1
Lastpage
4
Abstract
In this paper, a novel analytical model for calculating the partial self-inductance of bond wires in dependent on bonding parameters such as loop height, distance between bonding positions and the thickness of the metallization on which the wire is bonded, is derived for the first time. An excellent correlation is obtained between inductances extracted using our proposed model and those extracted using Ansys Q3D, with a maximum deviation of approximately 1%. Furthermore, methods for minimizing the inductance of bond wires, based on the definitions of loop and partial inductances are discussed. Test bond wire structures are designed, fabricated and measured to quantify the implemented method.
Keywords
integrated circuit design; integrated circuit metallisation; integrated circuit modelling; lead bonding; Ansys Q3D; bond wire interconnects; bonding parameter; bonding position; inductance minimization; inductance modeling; loop height; loop inductance; metallization thickness; partial self-inductance; test bond wire structure design; test bond wire structure fabrication; test bond wire structure measurement; Analytical models; Bonding; Inductance; Integrated circuit interconnections; Integrated circuit modeling; Solid modeling; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on
Conference_Location
Paris
Print_ISBN
978-1-4673-5678-7
Type
conf
DOI
10.1109/SaPIW.2013.6558344
Filename
6558344
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