DocumentCode :
618537
Title :
Fast estimation of high-speed signal integrity for coupled PCB interconnects
Author :
Eudes, T. ; Ravelo, B. ; Lacrevaz, Thierry ; Flechet, Bernard
Author_Institution :
Electron. & Syst. Dept., IRSEEM, St. Étienne-du-Rouvray, France
fYear :
2013
fDate :
12-15 May 2013
Firstpage :
1
Lastpage :
4
Abstract :
A predictive signal integrity (SI) model of coupled PCB interconnects for high-speed application is stated. It is derived from the analytical modeling of coupling matrices between neighboring transmission lines (TLs). The overall ABCD matrix is regenerated and manipulated by using the modal approach. Afterwards, the S-parameters of the structure are substantially extracted for forecasting the behavior SI propagating along the underlying interconnections. In order to reveal the effectiveness of the fast model developed, EM/circuit co-simulations with commercial tool were performed both in the frequency- and time-domains with 1Gbps-rate-mixed signals. Different configurations were undertaken. The validity of the centimeter length coupling model hereby with respect to the geometrical parameters of the interconnect structures is also investigated. Finally, potential applications for high-speed systems are discussed, especially for non-symmetrical coupled lines and microelectronic interconnects.
Keywords :
S-parameters; frequency-domain analysis; matrix algebra; printed circuit interconnections; time-domain analysis; transmission lines; EM-circuit co-simulation; S-parameters; SI behavior; analytical modeling; bit rate 1 Gbit/s; centimeter length coupling model; coupled PCB interconnect; coupling matrices; frequency domain; geometrical parameter; high-speed application; high-speed signal integrity; high-speed systems; interconnect structures; microelectronic interconnects; modal approach; nonsymmetrical coupled lines; overall ABCD matrix; predictive SI model; predictive signal integrity model; time-domain; transmission lines; Couplings; Integrated circuit interconnections; Integrated circuit modeling; Mathematical model; Numerical models; Silicon; Transmission line matrix methods; Coupled non-symmetrical interconnects; PCB; modal approach; modeling method; signal integrity (SI);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5678-7
Type :
conf
DOI :
10.1109/SaPIW.2013.6558348
Filename :
6558348
Link To Document :
بازگشت