Title :
Step response sensitivity of VLSI interconnects
Author :
Wardzinska, Agnieszka ; Bandurski, Wojciech
Author_Institution :
Poznan Univ. of Technol., Poznan, Poland
Abstract :
In the paper sensitivity of the voltage step response of the system inverter-interconnect-inverter with respect to selected parameters is considered. The sensitivity coefficients for normalized parameters are given. These formulas correspond with sensitivity coefficients to interconnect RLC parameters and input and output parameters. The sensitivity is calculated directly from step response formula. The closed form formula for the output response allows to present closed form formulas the for sensitivity.
Keywords :
RLC circuits; VLSI; integrated circuit interconnections; integrated circuit modelling; step response; VLSI Interconnects; interconnect RLC parameters; normalized parameter; sensitivity coefficient; step response formula; system inverter-interconnect-inverter; voltage step response sensitivity; Approximation methods; Integrated circuit interconnections; Integrated circuit modeling; Power transmission lines; Resistance; Scattering parameters; Sensitivity; RLC transmission line; VLSI interconnect; sensitivity; step response;
Conference_Titel :
Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5678-7
DOI :
10.1109/SaPIW.2013.6558349
