• DocumentCode
    618830
  • Title

    Smart anti-tampering algorithm design for single phase smart meter applied to AMI systems

  • Author

    Ngamchuen, Suchat ; Pirak, Chaiyod

  • Author_Institution
    Sirindhorn Int. Thai-German Grad. Sch. of Eng., King Mongkut´s Univ. of Technol. North Bangkok, Bangkok, Thailand
  • fYear
    2013
  • fDate
    15-17 May 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    An anti-tampering function is an essential part in a smart meter applied to AMI systems. It effectively helps the power utility to detect tampering events in order to reduce revenue loss, and prevent the smart meter from non-technical damages. In this paper, we have proposed a smart anti-tampering algorithm for a single phase smart meter by using a single chip solution. The single chip solution is not only able to detect multiple tampering events, but also has a special measuring capability of neutral current. Essentially, the smart anti-tampering algorithms is implemented to help the smart meter overcoming the tampering events of bypassing the main line and neutral line, reverse connection of input and output of the smart meter, connecting for avoidance of billing calculation, and cover frame or cover terminal opening. As a result, the proposed algorithm offers a wide dynamic range of tampering event detection, a low-probability of false detection, and a fast speed of tampering detection. Furthermore, in the case of small energy measurement, the proposed algorithm still yields a precise and accurate tampering detection capability.
  • Keywords
    security; smart meters; AMI system; billing calculation avoidance; main line bypassing; multiple tampering event detection; neutral current; neutral line bypassing; reverse connection; single chip solution; single phase smart meter; smart antitampering algorithm design; Current measurement; Current transformers; Electricity; Energy measurement; Registers; Switching circuits; Voltage measurement; AMI systems; Anti-tampering; False detection; Non-technical damages; Smart meter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), 2013 10th International Conference on
  • Conference_Location
    Krabi
  • Print_ISBN
    978-1-4799-0546-1
  • Type

    conf

  • DOI
    10.1109/ECTICon.2013.6559617
  • Filename
    6559617