Title :
Investigation of small electrical resistance of NiTi shape memory alloys in the application of damage detection
Author :
Chatwaranon, Chatchai ; Wongsa, S. ; Buasri, Taywin ; Khantachawana, Anak
Author_Institution :
Dept. of Control Syst. & Instrum. Eng., King Mongkut´s Univ. of Technol. Thonburi, Bangkok, Thailand
Abstract :
Applications of shape memory alloys (SMAs) as damage sensors have been widely studied in structural health monitoring. Monitoring a significant change in electrical resistance of SMAs can indicate the phase transformation of SMAs. The possibility of using the electrical resistance of SMAs as an indicator of damage in the materials has been investigated. We continuously monitored the behaviour of electrical resistance, as well as the strain, under the tensile test which is used as the simulated crack propagation. Wavelet transform were used to extract the trend of the noisy electrical resistance raw data, measured by the four-point-probe technique. We determined that the electrical resistance variation of the SMA wire is correlated with the strain and can possibly be used in damage detection stage.
Keywords :
cracks; electric resistance; electric sensing devices; materials testing; nickel alloys; shape memory effects; titanium alloys; NiTi; crack propagation; damage sensors; electrical resistance; four-point-probe technique; phase transformation; shape memory alloys; Electrical resistance measurement; Filter banks; Market research; Monitoring; Resistance; Strain; Stress; Discrete Wavelet Transform; Electrical Monitoring; Shape Memory Alloys; Trend Extraction;
Conference_Titel :
Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), 2013 10th International Conference on
Conference_Location :
Krabi
Print_ISBN :
978-1-4799-0546-1
DOI :
10.1109/ECTICon.2013.6559648