Title :
A X-band switched-line 5-bit phase shifter with RF MEMS multithrow switches
Author :
Du, Yun ; Bao, J. ; He, Zhaoshui ; Jiang, Jianliang
Author_Institution :
Dept. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
In this paper, a 5-bit switched-line phase shifter is designed, processed and tested for X-band application, which is based on packaged RF MEMS single-pole double-throw(SPDT) and single-pole four-throw(SP4T) switches to get an compact structure. The design and optimization are carried out by analyzing the non-ideal performance of packaged RF MEMS switches and extracting their circuit model parameters. The effects of the bonding-wire connecting RF MEMS switches and peripheral circuits are also analyzed and modeled. The 5-bit phase shifter shows the average measured insertion loss of -3.1 dB, the average return loss of -21.1 dB, and the average absolute phase error of 2.2° at 10GHz. By comparison of simulations and measurements, this paper proposes that the main factors to effect the performances of phase shifters with packaged MEMS switches are parasitic inductances introduced by the bonding-wire and limited isolation of the used switches.
Keywords :
electronics packaging; lead bonding; microswitches; microwave phase shifters; microwave switches; RF MEMS SPDT switches; RF MEMS multithrow switches; SP4T switches; X-band circuit model parameters; X-band switched-line 5-bit phase shifter; average absolute phase error; bonding-wire; compact structure; frequency 10 GHz; limited isolation; packaged RF MEMS single-pole double-throw switches; packaged RF MEMS switches; peripheral circuits; return loss; single-pole four-throw switches; Inductance; Integrated circuit modeling; Micromechanical devices; Microswitches; Phase shifters; Radio frequency; RF MEMS; multithrow switches; phase shifter;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location :
Suzhou
Electronic_ISBN :
978-1-4673-6351-8
DOI :
10.1109/NEMS.2013.6559735