DocumentCode :
618959
Title :
A Si-Glass based pressure sensor with a single piezoresistive element for harsh environment applications
Author :
Hong Zhang ; Huiming Xu ; Yan Li ; Zijun Song ; Haisheng San ; Yuxi Yu
Author_Institution :
Sch. of Phys. & Mech. & Electr. Eng., Xiamen Univ., Xiamen, China
fYear :
2013
fDate :
7-10 April 2013
Firstpage :
348
Lastpage :
351
Abstract :
A Si-Glass based MEMS piezoresistive pressure sensor is designed for harsh environment applications, such as vibration, shock and environment conditions with humidity, alkalescence or acidity, electrostatic particles and so on. The sensor chips were fabricated using SOI wafer-glass anodic bonding technology, which enables a single boron-implanted piezoresistor to be on lower surface of silicon diaphragm and be vacuum-sealed in glass cavity. The sensing signals were led out by using the embedded Al electrode structure at the bonding interface of Si-glass to connect single piezoresistor, and two large-area Ni-Au pads are used to electrically connect to the print circuit board (PCB) by using the drag soldering technology instead of gold wire bonding. The characteristics of voltage-pressure were measured with constant current under different temperature conditions. A temperature compensation technology is used to calibrate the measured results, by which the sensitivity of 116 mV/ (mA·MPa) and accuracy of 5.8% F.S. are obtained.
Keywords :
aluminium; calibration; compensation; diaphragms; electrochemical electrodes; elemental semiconductors; glass; microfabrication; microsensors; piezoresistive devices; pressure sensors; printed circuits; silicon; silicon compounds; silicon-on-insulator; soldering; wafer bonding; MEMS piezoresistive pressure sensor; Ni-Au; PCB; SOI; Si-Al-SiO2; bonding interface; boron implanted piezoresistor; calibration; drag soldering technology; embedded Al electrode structure; glass cavity; harsh environment; printed circuit board; sensor chip fabrication; silicon diaphragm; temperature compensation technology; vacuum seal; voltage pressure measurement; wafer glass anodic bonding technology; Bonding; Micromechanical devices; Piezoresistance; Silicon; Temperature; Temperature measurement; Temperature sensors; MEMS; anodic bonding; harsh environments; piezoresistive pressure sensor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location :
Suzhou
Electronic_ISBN :
978-1-4673-6351-8
Type :
conf
DOI :
10.1109/NEMS.2013.6559748
Filename :
6559748
Link To Document :
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