• DocumentCode
    619001
  • Title

    Dual-gate silicon carbide (SiC) lateral nanoelectromechanical switches

  • Author

    He, Tian ; Rui Yang ; Rajgopal, Srihari ; Bhunia, Swarup ; Mehregany, Mehran ; Feng, Philip X.-L

  • Author_Institution
    Electr. Eng., Case Western Reserve Univ., Cleveland, OH, USA
  • fYear
    2013
  • fDate
    7-10 April 2013
  • Firstpage
    554
  • Lastpage
    557
  • Abstract
    We present demonstration and experimental results of four-terminal nanoscale electromechanical switches with a novel dual-gate design in a lateral configuration based on polycrystalline silicon carbide (poly-SiC) nanocantilevers. The switches operate at both room temperature and high temperature up to T 500oC in ambient air with enhanced control over the distributed electrostatic actuation force, and also enable recovery from stiction at contact. We have experimentally demonstrated multiple switching cycles of these nanomechanical switches with different actuation control schemes, and active release from stiction by exploiting a repulsive mechanism. In combination with modeling of cantilever deflection, the experiments help reveal the coupled electromechanical behavior of the device when making contact during switching operations, and suggest possible correlation between the switch degradation observed over cycles and the elastic deformation of nanocantilevers.
  • Keywords
    cantilevers; elastic deformation; microswitches; nanoelectromechanical devices; silicon compounds; SiC; active release; actuation control schemes; cantilever deflection; distributed electrostatic actuation force; dual-gate design; elastic deformation; four-terminal nanoscale electromechanical switches; lateral configuration; multiple switching cycles; polycrystalline nanocantilevers; repulsive mechanism; switch degradation; temperature 293 K to 298 K; Contacts; Current measurement; Logic gates; Nanoelectromechanical systems; Silicon carbide; Structural beams; Switches; Dual-Gate; High Termperature; Nanoelectromechanical Systems (NEMS); Silicon Carbide (SiC); Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
  • Conference_Location
    Suzhou
  • Electronic_ISBN
    978-1-4673-6351-8
  • Type

    conf

  • DOI
    10.1109/NEMS.2013.6559791
  • Filename
    6559791