DocumentCode
619001
Title
Dual-gate silicon carbide (SiC) lateral nanoelectromechanical switches
Author
He, Tian ; Rui Yang ; Rajgopal, Srihari ; Bhunia, Swarup ; Mehregany, Mehran ; Feng, Philip X.-L
Author_Institution
Electr. Eng., Case Western Reserve Univ., Cleveland, OH, USA
fYear
2013
fDate
7-10 April 2013
Firstpage
554
Lastpage
557
Abstract
We present demonstration and experimental results of four-terminal nanoscale electromechanical switches with a novel dual-gate design in a lateral configuration based on polycrystalline silicon carbide (poly-SiC) nanocantilevers. The switches operate at both room temperature and high temperature up to T 500oC in ambient air with enhanced control over the distributed electrostatic actuation force, and also enable recovery from stiction at contact. We have experimentally demonstrated multiple switching cycles of these nanomechanical switches with different actuation control schemes, and active release from stiction by exploiting a repulsive mechanism. In combination with modeling of cantilever deflection, the experiments help reveal the coupled electromechanical behavior of the device when making contact during switching operations, and suggest possible correlation between the switch degradation observed over cycles and the elastic deformation of nanocantilevers.
Keywords
cantilevers; elastic deformation; microswitches; nanoelectromechanical devices; silicon compounds; SiC; active release; actuation control schemes; cantilever deflection; distributed electrostatic actuation force; dual-gate design; elastic deformation; four-terminal nanoscale electromechanical switches; lateral configuration; multiple switching cycles; polycrystalline nanocantilevers; repulsive mechanism; switch degradation; temperature 293 K to 298 K; Contacts; Current measurement; Logic gates; Nanoelectromechanical systems; Silicon carbide; Structural beams; Switches; Dual-Gate; High Termperature; Nanoelectromechanical Systems (NEMS); Silicon Carbide (SiC); Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location
Suzhou
Electronic_ISBN
978-1-4673-6351-8
Type
conf
DOI
10.1109/NEMS.2013.6559791
Filename
6559791
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