Title :
Induced-transparency in silicon-on-insulator based novel resonator systems
Author :
Danfeng Cui ; Chenyang Xue ; Chao Liu ; Liping Wei ; Yonghua Wang ; Jun Liu
Abstract :
In the paper, Coupled-resonator-induced-transparency (CRIT) phenomenon in a novel integrated on-chip optical resonator system is experimentally demonstrated. The system is composed of a four-ring resonator with 20 μm diameter on silicon, whose spectrum has a narrow transparency peak with low group velocity. The CRIT effect is observed in the optical coupled-resonator due to the classical destructive interference. This system can be used to study the slow and fast light experiments because of its simplicity and flexibility. In this work, a CRIT resonance with a quality factor of 7.2×104 is demonstrated with the same cavity size and the power coupling of the system is 60%, which agree well with the theoretical analysis. The through and drop transmission spectra of the resonator are coincided well with each other.
Keywords :
Q-factor; integrated optoelectronics; micro-optomechanical devices; micromechanical resonators; optical resonators; silicon-on-insulator; CRIT effect; MEMS technology; classical destructive interference; coupled-resonator-induced-transparency phenomenon; drop transmission spectra; four-ring resonator; integrated on-chip optical resonator system; low group velocity; power coupling; quality factor; resonator systems; silicon-on-insulator; size 20 mum; Integrated optics; Interference; Optical coupling; Optical ring resonators; Silicon; System-on-chip; coupled-resonator-induced-transparency (CRIT); destructive interference; high-Q; ring resonator;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location :
Suzhou
Electronic_ISBN :
978-1-4673-6351-8
DOI :
10.1109/NEMS.2013.6559798