• DocumentCode
    619020
  • Title

    Fabrication of nanopores using electron beam

  • Author

    Tao Xu ; Xiao Xie ; Litao Sun

  • Author_Institution
    Key Lab. of MEMS of Minist. of Educ., Southeast Univ., Nanjing, China
  • fYear
    2013
  • fDate
    7-10 April 2013
  • Firstpage
    637
  • Lastpage
    640
  • Abstract
    Sub-5 nm nanopores are widely used in single-molecule detections for biological and chemical applications. However, the traditional fabrication methods are difficult to reduce pore size to sub-5 nm. Focused electron beam irradiation inside a transmission electron microscope (TEM) is verified experimentally to be an effectively straightforward way to fabricate such small pores. The fabrication process can be explained by a simple physical collision model. We also fabricate graphene nanopores under various temperatures. The results verify that drilling at high temperature and direct thermal heating treatment can be beneficial to fabricate carbon nanostructure with high crystallization, which will promote the study of biological measurement. High temperature could also modulate the duration of fabrication, which can enhance the size control during nanopore fabrication.
  • Keywords
    electron beam effects; graphene; heat treatment; nanofabrication; nanoporous materials; transmission electron microscopy; C; TEM; biological application; biological measurement; carbon nanostructure; chemical application; crystallization; direct thermal heating treatment; drilling; fabrication duration; fabrication methods; fabrication process; focused electron beam irradiation; graphene nanopores; nanopore fabrication; physical collision model; pore size; single-molecule detections; size control; transmission electron microscope; DNA; Electron beams; Fabrication; Graphene; Nanobioscience; Radiation effects; Temperature measurement; TEM; electron beam irradiation; fabrication; nanopore;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
  • Conference_Location
    Suzhou
  • Electronic_ISBN
    978-1-4673-6351-8
  • Type

    conf

  • DOI
    10.1109/NEMS.2013.6559810
  • Filename
    6559810