Title :
Study of ASIC self-destruction technology based on MEMS initiator
Author :
Zhao Yue ; Li Kang ; Lou Wenzhong ; Li Dongguang ; Miao Zhihui
Author_Institution :
Nat. Key Lab. of Mechatron. Eng. & Control, Beijing Inst. of Technol., Beijing, China
Abstract :
MEMS initiator has been developed rapidly for its low detonating power and small volume. MEMS metal bridge as one type of the MEMS initiators, which has the same process with ASIC (Application-specific integrated circuit). In this paper, one novel ASIC self-destruction technology in chip level mainly based on MEMS metal bridge initiator is presented. A typical experimental structure was designed. Based on this structure, a simulation model was built. Through the simulation, when the MEMS metal bridge made by proper material was excited by pulse current, the circuits of the ASIC could be destroyed immediately because of the electric blasting produced by excited metal bridge. The conclusion was that the self-destruction technology can achieve the self-destruction of ASIC in chip level.
Keywords :
CMOS integrated circuits; application specific integrated circuits; integrated circuit design; micromechanical devices; ASIC self-destruction technology; CMOS process; MEMS metal bridge initiator; MEMS metal bridge simulation model; application-specific integrated circuit; electric blasting; low detonating power; Application specific integrated circuits; Bridge circuits; Integrated circuit modeling; Metals; Micromechanical devices; Resistance; ASIC; metal bridge; self-destruction;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location :
Suzhou
Electronic_ISBN :
978-1-4673-6351-8
DOI :
10.1109/NEMS.2013.6559858
