DocumentCode :
619143
Title :
Realization of quartz MEMS accelerometer based on flip chip process
Author :
Jinxing Liang ; Sujin Cui ; Liyuan Zhang ; Ancheng Shao
Author_Institution :
Key Lab. of Micro-Inertial Instrum. & Adv. Navig. Technol., Southeast Univ., Nanjing, China
fYear :
2013
fDate :
7-10 April 2013
Firstpage :
1194
Lastpage :
1197
Abstract :
This research attends to provide a simple and effective way to precisely assemble a quartz MEMS accelerometer, which is composed of a double-ended tuning fork (DETF) force transducer, and a base-proof mass structure. Flip chip method is proposed to bond the two sides of DETF in length direction onto the base and proof mass structure via AuSn solder utilizing the self alignment function of reflow process. Finite element analysis method is used to design and optimize the sensor structure including the dimensions of DETF, mass proof and solder bump height and so on. The optimized accelerometer sensitivity is about 50 Hz/g at a fixed planar dimension in 4 mm × 8 mm. The DETF is fabricated on a 100 μm thick Z cut wafer and the monolithic base-proof mass structure, which is linked with a thinned flexure, is fabricated on a 300 μm thick wafer using well established quartz MEMS wet etching process.
Keywords :
accelerometers; assembling; etching; finite element analysis; flip-chip devices; force sensors; gold alloys; microsensors; quartz; reflow soldering; tin alloys; transducers; AuSn; DETF; Z cut wafer; double-ended tuning fork force transducer; finite element analysis method; flip chip process; monolithic base-proof mass structure; optimized accelerometer sensitivity; quartz MEMS accelerometer realization; quartz MEMS wet etching process; reflow process; self alignment function; sensor structure design; sensor structure optimization; size 100 mum; size 300 mum; solder bump height; Accelerometers; Bonding; Flip-chip devices; Force; Metals; Micromechanical devices; Sensitivity; DETF; accelrometer; flip chip; quartz MEMS;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
Conference_Location :
Suzhou
Electronic_ISBN :
978-1-4673-6351-8
Type :
conf
DOI :
10.1109/NEMS.2013.6559933
Filename :
6559933
Link To Document :
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