• DocumentCode
    619149
  • Title

    Mechanical property of nanoscale ZnO/Al2O3 multilayers: An investigation by nano-indentation

  • Author

    Wang, X.Q. ; Ding, J.N. ; Yuan, N.Y. ; Cheng, George G. ; Zhu, Y.Y. ; Kan, B.

  • Author_Institution
    Center for Micro/Nano Sci. & Technol., Jiangsu Univ., Zhenjiang, China
  • fYear
    2013
  • fDate
    7-10 April 2013
  • Firstpage
    1222
  • Lastpage
    1225
  • Abstract
    Nanoscale ZnO/Al2O3 multilayers were prepared on Silicon substrates by atomic layer deposition (ALD) method at 200°C. To understand the size effect of ZnO nanoscale layers on hardness, the mechanical properties of the ZnO/Al2O3 multilayers were investigated using nano-indentation technique. As the bilayer period decreases from 60 to 2 nm, the micro-structures of ZnO layers changed from polycrystalline to amorphous. In the bilayer period interval of 60 to 6 nm, the variation of hardness versus bilayer period is similar to Hall-Patch relation, with maximum hardness and elastic modulus of ~10.69GPa and ~138.1GPa, respectively. However when the bilayer period is smaller than 6 nm, the nanolaminates became softer than the single ZnO film.
  • Keywords
    II-VI semiconductors; alumina; atomic layer deposition; elastic moduli; grain size; hardness; laminates; multilayers; nanocomposites; nanofabrication; nanoindentation; wide band gap semiconductors; yield stress; zinc compounds; Hall-Patch relation; Si; ZnO layer microstructures; ZnO nanoscale layers; ZnO-Al2O3; atomic layer deposition method; bilayer period interval; maximum elastic modulus; maximum hardness; mechanical property; nanoindentation technique; nanolaminates; nanoscale ZnO-alumina multilayers; silicon substrates; size effect; temperature 200 degC; Aluminum oxide; Atomic layer deposition; Films; Nanoscale devices; Nonhomogeneous media; Substrates; Zinc oxide; atomic layer deposition method; mechanical propoerty; nano-indentation; nanoscale ZnO/Al2O3 multilayers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
  • Conference_Location
    Suzhou
  • Electronic_ISBN
    978-1-4673-6351-8
  • Type

    conf

  • DOI
    10.1109/NEMS.2013.6559939
  • Filename
    6559939