• DocumentCode
    619455
  • Title

    Coupling-aware length-ratio-matching routing for capacitor arrays in analog integrated circuits

  • Author

    Kuan-Hsien Ho ; Hung-Chih Ou ; Yao-Wen Chang ; Hui-Fang Tsao

  • Author_Institution
    Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2013
  • fDate
    May 29 2013-June 7 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Capacitance-ratio mismatch in a switched-capacitor circuit could significantly degrade circuit performance. In the nanometer era, the parasitic effects and lengths of interconnects both have significant impacts on the capacitance ratio. This paper presents the first routing work for the problem of coupling-aware length-ratio-matching routing for capacitor arrays in analog integrated circuits. The router adopts a two-stage approach of topology generation followed by detailed routing to route unit capacitors such that the coupling-aware wire length ratio can match the desired capacitance ratio. Given a length ratio, in particular, the length-ratio-matching routing problem can be handled by transforming the problem into an easier classical wirelength minimization one. Experimental results show that our algorithm can solve the addressed problem with substantially smaller costs.
  • Keywords
    analogue integrated circuits; capacitance; capacitor switching; integrated circuit design; integrated circuit interconnections; minimisation; nanoelectronics; network routing; network topology; analog integrated circuit; capacitance ratio mismatch; capacitor array; circuit interconnection; classical wirelength minimization problem; coupling aware length ratio matching routing; nanometer era; parasitic effect; route unit capacitor; switched capacitor circuit; topology generation; Capacitance; Capacitors; Couplings; Routing; Steiner trees; Tiles; Topology; Analog ICs; Physical Design; Routing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0738-100X
  • Type

    conf

  • Filename
    6560599