DocumentCode :
619478
Title :
On testing timing-speculative circuits
Author :
Feng Yuan ; Yannan Liu ; Jone, Wen-Ben ; Qiang Xu
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin, China
fYear :
2013
fDate :
May 29 2013-June 7 2013
Firstpage :
1
Lastpage :
6
Abstract :
By allowing the occurrence of infrequent timing errors and correcting them online, circuit-level timing speculation is one of the most promising variation-tolerant design techniques. How to effectively test timing-speculative circuits, however, has not been addressed in the literature. This is a challenging problem because conventional scan techniques cannot provide sufficient controllability and observability for such circuits. In this paper, we propose novel techniques to achieve high fault coverage for timing-speculative circuits without incurring high design-for-testability cost. Experimental results on various benchmark circuits demonstrate the effectiveness of the proposed solution.
Keywords :
design for testability; integrated circuit testing; timing circuits; circuit-level timing speculation; controllability; conventional scan techniques; design-for-testability cost; infrequent timing errors; observability; timing-speculative circuits testing; variation-tolerant design techniques; Benchmark testing; Circuit faults; Clocks; Delays; Latches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
Conference_Location :
Austin, TX
ISSN :
0738-100X
Type :
conf
Filename :
6560623
Link To Document :
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